R&D Performance | HITS Vision Inspection

R&D

R&D Performance

Recognized engineering achievements and award-winning systems.

IR52 Jang Young-sil Award emblem

Award

IR52 Jang Young-sil Award

The IR52 Jang Young-sil Award recognizes leading industrial research and engineering achievement in Korea. HITS received the award for its semiconductor inspection technologies.

HITS award years2014 · 2012 · 2008

Awarded Systems

Award-winning systems

WIRE BOND Automatic Inspection System

WIRE BOND Automatic Inspection System

Automatic inspection of defects in 20–50 μm gold wires during semiconductor packaging.

Semiconductor Package 2D/3D High-Speed Inspection System

Semiconductor Package 2D/3D High-Speed Inspection System

High-speed precision inspection for chromatic-confocal wire bonding and microscopic die cracks.