R&D
Key Technology
Specialized technologies and intellectual-property portfolio.
Specialized Technologies
HITS proprietary technologies.
| Field | Technology | Description |
|---|---|---|
| Semiconductor | DW-AVI System | 2D high-speed inspection and 3D-height measurement for W/D and D/A processes. |
| Semiconductor | Mold AOI System | Mold appearance inspection. |
| Semiconductor | F/C Bonding Auto Loader & Unloader | PCB and jig vision alignment with automatic loading. |
| Semiconductor | Module Inline System | Automatic module test handler and production-data automation. |
| Semiconductor | Packing Inline Automated System | Tray/reel packing logistics and production-data automation. |
| Semiconductor | Wafer 3D Measuring System | Wafer thickness measurement. |
| Semiconductor | TSV 3D Measuring System | Via-hole and aspect-ratio 3D measurement. |
| Semiconductor | NIR Crack Inspection System | NIR vision crack inspection for FCBGA. |
| Semiconductor | SWIR Defect Inspection System | SWIR vision crack inspection for FCBGA. |
| Display (film, LCD, OLED) | Film Auto Attach & Surface Inspection | Inspection of MOF, prism, diffuser and polarizer film. |
| Display (film, LCD, OLED) | Copper Foil Surface Inspection System | Copper-surface inspection. |
| Display (film, LCD, OLED) | Glass Surface Inspection System | Vision inspection for glass cutting surfaces, surface quality and micro-cracks. |
| Display (film, LCD, OLED) | Lighting Inspection System | Defective-pixel inspection and repair-coordinate measurement during panel lighting. |
| Display (film, LCD, OLED) | BLU_CG Attach System | Patented technology. |
| Secondary battery | Battery Surface Inspection System | Welding quality and surface inspection. |
| Secondary battery | Battery Film Surface Inspection System | Laser-notching condition quality inspection during winding. |
Intellectual Property
Technology protected by intellectual property.
| Field | Record | Type |
|---|---|---|
| Display | Edge-surface inspection method for LCD panels using a line-scan camera | Patent |
| Display | Apparatus and method for side-surface inspection of LCD panels | Patent |
| Display | Edge inspection apparatus for LCD cells | Utility Model |
| Display | LCD edge-grinder vision program | Program Registration |
| Display | Vision program for burr, chipping and breakage on LCD edges | Program Registration |
| Display | LCD cell inspection vision system | International Patent |
| Display | Material inspection system for winding machines | Patent Pending |
| Display | Height measurement system using a probe | Patent Pending |
| Display | PoP mold inspection system | Patent Pending |
| Display | PoP mold illumination system | Patent Pending |
| Semiconductor | Semiconductor ball-attach and PRS vision program | Program Registration |
| Semiconductor | Semiconductor marking inspection vision program | Program Registration |
| Semiconductor | Semiconductor package inspection system and inspection method using it | Patent |
| Semiconductor | Wire-bonding inspection apparatus | Patent |
| Semiconductor | Semiconductor Package Inspection System and Inspection Method Using Semiconductor Inspection System | International Patent |
| Semiconductor | Semiconductor JEDEC tray inline packing equipment and method | Patent Pending |
| Semiconductor | Semiconductor 7" / 13" reel packing equipment and method | Patent Pending |
| Other | Apparatus and method for automatically measuring vestibular-system disorders | Utility Model |