封装检测 | HITS 视觉检测

Products

封装检测

针对超薄封装在打标后的字符、塑封和焊球区域进行检测。

PKG Inspection System

针对超薄封装在打标后的字符、塑封和焊球区域进行检测。

核心功能

  • Applicable to FCBGA Substrate
  • Inspection on the front and back side surface of substrate
  • Accuracy : 10um
  • Mold : Chip out, Incomplete mold, Void hole, Bubble, Porosity, Crack Sticking, Scratch
  • Marking : Illegible Mark, Double Mark, Incorrect orientation, Wrong Mark, Misplace Mark, No Mark
  • Ball Land : Cu Exposure, Scratch, Contamination, Foreign Material, Sub Broken/Pressed
系统构成
M/Z Loading, Transfer Rail, Top Vision Inspection, Btm Vision Inspection, M/Z Unloading