晶圆紫外线检测系统 | HITS 视觉检测

Products

晶圆紫外线检测系统

自动完成晶圆环定位、紫外视觉检测、NG 映射与复核的系统。

Wafer UV Inspection System

UV vision inspection system for the sawing line. It handles wafer rings automatically and screens sawn wafers for defects, mapping every NG die and presenting it for operator review.

核心功能

  • Automated rail, buffer and gripper handling for wafer-ring loading and unloading
  • Stage X/Y, vision Z and vacuum control for stable inspection positioning
  • UV vision inspection of sawn wafers with defect mapping and operator review
  • Integrated expander and marking-unit interlocks
  • Recipe-based device control with HMI status monitoring
系统构成
Loading Rail, Buffer, Gripper, Wafer Ring Guide, Stage X/Y, Expander, Vacuum Table, Vision Z, UV Vision, Marking Unit, Mapping & Review, Unloading Rail

Wafer CD & Overlay Inspection System

Wafer inspection system that measures critical-dimension size and overlay alignment and screens defects, with a wafer map and review station for verifying results.

核心功能

  • CD (Critical Dimension) size measurement
  • Overlay alignment measurement
  • Defect inspection and classification
  • Wafer mapping with an operator review station
  • Dual inspection stations with independent optics and displays